Case number IPR2015-01994
Linear Technology Corporation v. In-Depth Test LLC > Documents
| Date Field | Doc. No. | Party | Description |
|---|---|---|---|
| Jan 29, 2016 | 9 | board | Decision - Denying Institution of Inter Partes Review - 37 C.F.R. 42.108 Download |
| Jan 29, 2016 | 3001 | board | Exhibit Download |
| Jan 8, 2016 | 8 | patent_own | In-Depth Test LLC Preliminary Response Download |
| Oct 20, 2015 | 7 | board | Decision - Denying Petitioner's Motion for Joinder under 35 USC 315(c) and 37 CFR 42.22 and 42.122(b) and Request for Shortened Response Time for Patent Owner's Preliminary Response Download |
| Oct 19, 2015 | 5 | potential_ | Power of Attorney Download |
| Oct 19, 2015 | 6 | potential_ | Related Matters Download |
| Oct 8, 2015 | 4 | board | Notice of Filing Date Accorded to Petition Download |
| Sep 28, 2015 | 1012 | petitioner | U.S. Patent No. 6,598,194 to Madge Download |
| Sep 28, 2015 | 1004 | petitioner | W. Ponik, Teradyne's J957 VLSI Test System - Getting VLSI to the Market on Time, December 1985, pp. 57-62 Download |
| Sep 28, 2015 | 1008 | petitioner | Diane K. Michelson, Statistically Calculating Reject Limits at Parametric Test, 1997 IEEE/CPMT International Electronics Manufacturing Technology Symposium, pp. 172-177 Download |
| Sep 28, 2015 | 2 | petitioner | Petition Download |
| Sep 28, 2015 | 1015 | petitioner | U.S. Patent No. 6,366,108 (O'Neill) Download |
| Sep 28, 2015 | 1016 | petitioner | IEEE, The Authoritative Dictionary of IEEE Standards Terms (7th Ed. 2000) Download |
| Sep 28, 2015 | 1 | petitioner | Power of Attorney Download |
| Sep 28, 2015 | 1011 | petitioner | U.S. Patent No. 6,240,329 to Sun Download |
| Sep 28, 2015 | 1006 | petitioner | A. Rao, A.P. Jayasumana, and Y.K. Malaiya, Optimal Clustering and Statistical Identification of Defective IC_s using IDDQ Testing, Defect Based Testing, 2000, Proceedings (IEEE), 30-35 (Apr. 30, 2000) Download |
| Sep 28, 2015 | 1010 | petitioner | Robert Trahan and Kevin Dean, A Comprehensive I.C. Yield Analysis System in RS1, 1990 IEEE/SEMI Advanced Manufacturing Conference, pp. 99-103 Download |
| Sep 28, 2015 | 1002 | petitioner | Declaration of Dr. Jacob Abraham Download |
| Sep 28, 2015 | 1009 | petitioner | C. Michael Whitney and Leslie Fowler, Motorola_s Engineering Data Analysis System - 10 Years of Analytical Techniques, Proceedings of the Twenty-Fifth Annual SAS User's Group International Conference, April 9-12, 2000, paper 44-25 Download |
| Sep 28, 2015 | 1013 | petitioner | U.S. Patent No. 5,497,381 to O_Donoghue Download |
| Sep 28, 2015 | 1007 | petitioner | Automotive Electronics Council, Guidelines for Part Average Testing, AEC - Q001-Rev A, October 8, 1998 Download |
| Sep 28, 2015 | 1014 | petitioner | U.S. Patent No. 5,240,866 to Friedman Download |
| Sep 28, 2015 | 3 | petitioner | Motion for Joinder Download |
| Sep 28, 2015 | 1001 | petitioner | U.S. Patent No. 6,792,373 to Tabor Download |
| Sep 28, 2015 | 1003 | petitioner | Curriculum Vitae of Dr. Jacob Abraham Download |
| Sep 28, 2015 | 1005 | petitioner | W. Robert Daasch, Variance Reduction Using Wafer Patterns in IddQ Data, in International Test Conference 2000 Proceedings, at pages 189-198 (Oct. 3, 2000) Download |
