Lone Star Silicon Innovations LLC v. Micron Technology, Inc. et al > Summary
Court Case Number 2:16-cv-01116
Filing Date Oct 7, 2016
Court Texas Eastern District Court
Status Unknown
Defendant
5Plaintiff Attorneys
5Lone Star Silicon Innovations LLC
Attorney Name: Jennifer Parker Ainsworth
Wilson Robertson & Cornelius
Lone Star Silicon Innovations LLC
Attorney Name: David A. Gosse
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Nicole L. Little
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Timothy Paul Maloney
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Joseph F. Marinelli
Fitch, Even, Tabin & Flannery LLP
Defendant Attorneys
16Micron Memory Japan, Inc.
Attorney Name: Jared Bobrow
Weil, Gotshal & Manges
Micron Technology, Inc.
Attorney Name: Jared Bobrow
Weil, Gotshal & Manges
Micron Semiconductor, Inc.
Attorney Name: Jared Bobrow
Weil, Gotshal & Manges
Micron Consumer Products Group, Inc.
Attorney Name: Jeremy J. Lang
Weil, Gotshal & Manges
Micron Memory Japan, Inc.
Attorney Name: Jeremy J. Lang
Weil, Gotshal & Manges
Micron Technology, Inc.
Attorney Name: Jeremy J. Lang
Weil, Gotshal & Manges
Micron Semiconductor, Inc.
Attorney Name: Jeremy J. Lang
Weil, Gotshal & Manges
Micron Consumer Products Group, Inc.
Attorney Name: Robert S. Magee
Weil, Gotshal & Manges
Micron Memory Japan, Inc.
Attorney Name: Robert S. Magee
Weil, Gotshal & Manges
Micron Technology, Inc.
Attorney Name: Robert S. Magee
Weil, Gotshal & Manges
Micron Semiconductor, Inc.
Attorney Name: Robert S. Magee
Weil, Gotshal & Manges
Micron Consumer Products Group, Inc.
Attorney Name: Melissa R. Smith
Gillam & Smith LLP
Micron Memory Japan, Inc.
Attorney Name: Melissa R. Smith
Gillam & Smith LLP
Micron Technology, Inc.
Attorney Name: Melissa R. Smith
Gillam & Smith LLP
Micron Semiconductor, Inc.
Attorney Name: Melissa R. Smith
Gillam & Smith LLP
Cause
35:271 Patent Infringement
Related Patents
Doc No | Title | Issue date |
---|---|---|
06388330 | Low dielectric constant etch stop layers in integrated circuit interconnects | May 14, 2002 |
06326231 | Use of silicon oxynitride ARC for metal layers | Dec 4, 2001 |
06103611 | Methods and arrangements for improved spacer formation within a semiconductor device | Aug 15, 2000 |
06097061 | Trenched gate metal oxide semiconductor device and method | Aug 1, 2000 |
06023085 | Core cell structure and corresponding process for NAND-type high performance flash memory device | Feb 8, 2000 |
05912188 | Method of forming a contact hole in an interlevel dielectric layer using dual etch stops | Jun 15, 1999 |
05872038 | Semiconductor device having an elevated active region formed in an oxide trench and method of manufacture thereof | Feb 16, 1999 |