Lone Star Silicon Innovations LLC v. Renesas Electronics Corporation et al > Summary
Court Case Number 3:17-cv-03981
Filing Date Jul 14, 2017
Termination Date Jan 22, 2018
Court California Northern District Court
Status Judgment - Motion Before Trial
JudgesWilliam Alsup
Plaintiff
Defendant
Plaintiff Attorneys
6Lone Star Silicon Innovations LLC
Attorney Name: Jennifer Parker Ainsworth
Wilson Robertson & Cornelius
Lone Star Silicon Innovations LLC
Attorney Name: Jon A Birmingham
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: David A. Gosse
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Nicole L. Little
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Timothy P. Maloney
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Joseph F. Marinelli
Fitch, Even, Tabin & Flannery LLP
Defendant Attorneys
11Renesas Electronics
Attorney Name: Jared A. Brandyberry
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Jason P. Grier
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Robert L. Hails Jr.
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Jason F. Hoffman
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Matthew D. Pearson
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Paul E. Poirot
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Michael Carlis Smith
Siebman Law, LLP
Renesas Electronics
Attorney Name: Theresa M. Weisenberger
Baker & Hostetler LLP
Renesas Electronics
Attorney Name: Jihee Ahn
Harris Sliwoski LLP
Renesas Electronics
Attorney Name: Michael Carlis Smith
Roth Law Firm
Renesas Electronics
Attorney Name: Wilmer R. Bottoms
Covington & Burling LLP
Cause
35:271 Patent Infringement
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 06388330 | Low dielectric constant etch stop layers in integrated circuit interconnects | May 14, 2002 |
| 06326231 | Use of silicon oxynitride ARC for metal layers | Dec 4, 2001 |
| 06153933 | Elimination of residual materials in a multiple-layer interconnect structure | Nov 28, 2000 |
| 06103611 | Methods and arrangements for improved spacer formation within a semiconductor device | Aug 15, 2000 |
| 06046089 | Selectively sized spacers | Apr 4, 2000 |
