Lone Star Silicon Innovations LLC v. Semiconductor Manufacturing International Corporation et al > Summary
Court Case Number 2:16-cv-01276
Filing Date Nov 16, 2016
Court Texas Eastern District Court
Status Unknown
Defendant
3Plaintiff Attorneys
5Lone Star Silicon Innovations LLC
Attorney Name: Jennifer Parker Ainsworth
Wilson Robertson & Cornelius
Lone Star Silicon Innovations LLC
Attorney Name: David A. Gosse
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Nicole L. Little
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Timothy P. Maloney
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Joseph F. Marinelli
Fitch, Even, Tabin & Flannery LLP
Defendant Attorneys
8SMIC Americas
Attorney Name: Jeffrey L. Johnson
Orrick Herrington & Sutcliffe
Semiconductor Manufacturing International (Shanghai) Corporation
Attorney Name: Jeffrey L. Johnson
Orrick Herrington & Sutcliffe
Semiconductor Manufacturing International (Shanghai) Corporation
Attorney Name: Jeffrey L. Johnson
Orrick Herrington & Sutcliffe
Semiconductor Manufacturing International (Shanghai) Corporation
Attorney Name: Jeffrey L. Johnson
Orrick Herrington & Sutcliffe
SMIC Americas
Attorney Name: Christopher Jene Richart
DLA Piper
Semiconductor Manufacturing International (Shanghai) Corporation
Attorney Name: Christopher Jene Richart
DLA Piper
Semiconductor Manufacturing International (Shanghai) Corporation
Attorney Name: Christopher Jene Richart
DLA Piper
Semiconductor Manufacturing International (Shanghai) Corporation
Attorney Name: Christopher Jene Richart
DLA Piper
Cause
35:271 Patent Infringement
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 06388330 | Low dielectric constant etch stop layers in integrated circuit interconnects | May 14, 2002 |
| 06103611 | Methods and arrangements for improved spacer formation within a semiconductor device | Aug 15, 2000 |
| 05973372 | Silicided shallow junction transistor formation and structure with high and low breakdown voltages | Oct 26, 1999 |
