Lone Star Silicon Innovations LLC v. Toshiba Corporation et al > Summary
Court Case Number 3:17-cv-04034
Filing Date Jul 18, 2017
Termination Date Jan 22, 2018
Court California Northern District Court
Status Judgment - Motion Before Trial
Appeal2018-1583
JudgesWilliam Alsup
Plaintiff
Plaintiff Attorneys
6Lone Star Silicon Innovations LLC
Attorney Name: Jennifer Parker Ainsworth
Wilson Robertson & Cornelius
Lone Star Silicon Innovations LLC
Attorney Name: Jon A Birmingham
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: David A. Gosse
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Nicole L. Little
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Timothy P. Maloney
Fitch, Even, Tabin & Flannery LLP
Lone Star Silicon Innovations LLC
Attorney Name: Joseph F. Marinelli
Fitch, Even, Tabin & Flannery LLP
Defendant Attorneys
18Toshiba
Attorney Name: Katherine C. Cheung
DLA Piper
Western Digital
Attorney Name: Keith B. Davis
Jones Day
Sandisk
Attorney Name: Keith B. Davis
Jones Day
Toshiba America Electronic Components
Attorney Name: John M. Guaragna
DLA Piper
Toshiba
Attorney Name: John M. Guaragna
DLA Piper
Toshiba America Electronic Components
Attorney Name: Saori Kaji
DLA Piper
Toshiba
Attorney Name: Saori Kaji
DLA Piper
Western Digital
Attorney Name: Gregory L. Lippetz
Jones Day
Sandisk
Attorney Name: Gregory L. Lippetz
Jones Day
Toshiba America Electronic Components
Attorney Name: Steven L Park
Paul Hastings
Toshiba
Attorney Name: Steven L Park
Paul Hastings
Toshiba America Electronic Components
Attorney Name: Gerald Takashi Sekimura
DLA Piper
Toshiba
Attorney Name: Gerald Takashi Sekimura
DLA Piper
Western Digital
Attorney Name: Jeffrey M. White
Jones Day
Sandisk
Attorney Name: Jeffrey M. White
Jones Day
Toshiba
Attorney Name: Steven L Park
DLA Piper
Toshiba America Electronic Components
Attorney Name: Steven L Park
DLA Piper
Cause
35:271 Patent Infringement
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 09121888 | Method of testing anti-high temperature performance of a magnetic head and apparatus thereof | Sep 1, 2015 |
| 06388330 | Low dielectric constant etch stop layers in integrated circuit interconnects | May 14, 2002 |
| 06023085 | Core cell structure and corresponding process for NAND-type high performance flash memory device | Feb 8, 2000 |
