Ocean Semiconductor LLC v. MediaTek Inc. et al > Summary
Court Case Number 6:20-cv-01210
Filing Date Dec 31, 2020
Termination Date Oct 3, 2022
Court Texas Western District Court
Status Dismissed - Other
JudgesAlan D. Albright
Plaintiff
Plaintiff Attorneys
3Ocean Semiconductor LLC
Attorney Name: Timothy Devlin
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Henrik D. Parker
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Alex H. Chan
Devlin Law Firm
Defendant Attorneys
5MediaTek
Attorney Name: Brian C. Nash
Pillsbury Winthrop Shaw Pittman
MediaTek
Attorney Name: David H. Harper
Haynes and Boone, LLP
MediaTek
Attorney Name: Stephanie N. Sivinski
Haynes and Boone, LLP
MediaTek
Attorney Name: David L. McCombs
Haynes and Boone, LLP
MediaTek
Attorney Name: Brian C. Nash
Morrison & Foerster
Counter Defendant
3Ocean Semiconductor LLC
Attorney Name: Henrik D. Parker
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Timothy Devlin
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Alex H. Chan
Devlin Law Firm
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 08676538 | Adjusting weighting of a parameter relating to fault detection based on a detected fault | Mar 18, 2014 |
| 07080330 | Concurrent measurement of critical dimension and overlay in semiconductor manufacturing | Jul 18, 2006 |
| 06968248 | Agent reactive scheduling in an automated manufacturing environment | Nov 22, 2005 |
| 06907305 | Agent reactive scheduling in an automated manufacturing environment | Jun 14, 2005 |
| 06836691 | Method and apparatus for filtering metrology data based on collection purpose | Dec 28, 2004 |
| 06725402 | Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework | Apr 20, 2004 |
| 06660651 | Adjustable wafer stage, and a method and system for performing process operations using same | Dec 9, 2003 |
