Ocean Semiconductors LLC v. Analog Devices, Inc. > Summary
Court Case Number 1:20-cv-12310
Filing Date Dec 31, 2020
Court Massachusetts District Court
Status Unknown
JudgesPatti B. Saris
Plaintiff
Defendant
Plaintiff Attorneys
9Ocean Semiconductor LLC
Attorney Name: Raymond P. Ausrotas
Arrowood LLP
Ocean Semiconductor LLC
Attorney Name: William F. McGonigle
Arrowood LLP
Ocean Semiconductor LLC
Attorney Name: Timothy Devlin
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Alex H. Chan
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Henrik D. Parker
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Raymond P. Ausrotas
Arrowood LLP
Ocean Semiconductor LLC
Attorney Name: Alex H. Chan
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: Henrik D. Parker
Devlin Law Firm
Ocean Semiconductor LLC
Attorney Name: William F. McGonigle
Arrowood LLP
Defendant Attorneys
12Analog Devices
Attorney Name: John Moulder
Arnold & Porter Kaye Scholer
Analog Devices
Attorney Name: Ali R. Sharifahmadian
Arnold & Porter Kaye Scholer
Analog Devices
Attorney Name: Matthew M. Wolf
Arnold & Porter Kaye Scholer
Analog Devices
Attorney Name: Thomas M. Damario Jr.
McDermott Will & Emery
Analog Devices
Attorney Name: Alexander P. Ott
McDermott Will & Emery
Analog Devices
Attorney Name: Annabel Rodriguez
McDermott Will & Emery
Analog Devices
Attorney Name: John Moulder
Willkie Farr & Gallagher
Analog Devices
Attorney Name: Alexander P. Ott
McDermott Will & Emery
Analog Devices
Attorney Name: Ali R. Sharifahmadian
Arnold & Porter Kaye Scholer
Analog Devices
Attorney Name: Annabel Rodriguez
McDermott Will & Emery
Analog Devices
Attorney Name: Matthew M. Wolf
Arnold & Porter Kaye Scholer
Analog Devices
Attorney Name: Thomas M. Damario Jr.
McDermott Will & Emery
Cause
15:1126 Patent Infringement
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 08676538 | Adjusting weighting of a parameter relating to fault detection based on a detected fault | Mar 18, 2014 |
| 07080330 | Concurrent measurement of critical dimension and overlay in semiconductor manufacturing | Jul 18, 2006 |
| 06968248 | Agent reactive scheduling in an automated manufacturing environment | Nov 22, 2005 |
| 06907305 | Agent reactive scheduling in an automated manufacturing environment | Jun 14, 2005 |
| 06836691 | Method and apparatus for filtering metrology data based on collection purpose | Dec 28, 2004 |
| 06725402 | Method and apparatus for fault detection of a processing tool and control thereof using an advanced process control (APC) framework | Apr 20, 2004 |
| 06660651 | Adjustable wafer stage, and a method and system for performing process operations using same | Dec 9, 2003 |
