Case number IPR2016-01833
Semiconductor Components Industries, LLC, doing business as ON Semiconductor v. In-Depth Test LLC > Summary
Court Case Number IPR2016-01833
Filing Date Sep 16, 2016
Court Patent Trial and Appeal Board
Status Terminated-Denied
Administrative JudgesJustin T. Arbes, Michael J. Fitzpatrick, Barry L. Grossman
Judge Writing the Final DecisionJustin T. Arbes
Claims Challenged in the Petition: 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20
Petitioner
Patent Owner
Petitioner Attorneys
4Patent Owner Attorneys
3In-Depth Test LLC
Attorney Name: Gary J. Fischman
Fischman Law PLLC
In-Depth Test LLC
Attorney Name: Joshua S. Wyde
The Law Firm of Joshua S. Wyde
In-Depth Test LLC
Attorney Name: Daniel Jay Noblitt
Noblitt & Newson, PLLC
Related Patents
| Doc No | Title | Issue date |
|---|---|---|
| 06792373 | Methods and apparatus for semiconductor testing | Sep 14, 2004 |
