Breaking up long-channel field effect transistor into smaller segments for reliability modeling | Patent Number 08875070

US 08875070 B2
Application Number13837348
Publication NumberUS 20140096094 A1
Pendency1 year, 7 months, 17 days
Filled DateMar 15, 2013
Priority DateOct 3, 2012
Publication DateApr 3, 2014
Expiration DateOct 28, 2018
Inventor/ApplicantsBonnie E. Weir
David Averill Bell
ExaminesWHITMORE, STACY
Art Unit2851
Technology Center2800
Assignments
Agere Systems Broadcom
Current
Lsi Broadcom
Current
Lsi BroadcomBroadcom
Original
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