Systems and methods for sub-zero threshold characterization in a memory cell | Patent Number 09378840

US 09378840 B2
Application Number14085553
Publication NumberUS 20150117097 A1
Pendency2 years, 7 months, 11 days
Filled DateNov 20, 2013
Priority DateOct 28, 2013
Publication DateApr 30, 2015
Expiration DateOct 27, 2033
Inventor/ApplicantsYu Cai
Yunxiang Wu
Erich F. Haratsch
ExaminesTECHANE, MUNA A
Art Unit2827
Technology Center2800
Assignments
Lsi Broadcom
Current
Agere Systems Broadcom
Current
Lsi BroadcomBroadcom
Original
Seagate Technology
Original
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