High efficiency interactive testing platform | Patent Number 11275677
US 11275677 B2Filled DateAug 26, 2020
Priority DateAug 27, 2019
Publication DateMar 4, 2021
Expiration DateAug 26, 2039
Inventor/ApplicantsTobias Mao
Julie Beckley
Nikolaos Diamantopoulos
Eskil Forsell
Colin McFarland
Pablo Lacerda de Miranda
Jeffrey Wong
Matthew Wardrop
Julie Beckley
Nikolaos Diamantopoulos
Eskil Forsell
Colin McFarland
Pablo Lacerda de Miranda
Jeffrey Wong
Matthew Wardrop
ExaminesLIN, KATHERINE Y
Art Unit2113
Technology Center2100
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