Detecting and mitigating anomalies and degradation associated with devices and their operations | Patent Number 11321581
US 11321581 B2Filled DateMay 5, 2020
Priority DateJun 7, 2019
Publication DateDec 10, 2020
Expiration DateJun 6, 2039
Inventor/ApplicantsCarol Wagih Sadek
Kyungduck Cha
Zohreh Asgharzadeh Talebi
Kyungduck Cha
Zohreh Asgharzadeh Talebi
ExaminesNIMOX, RAYMOND LONDALE
Art Unit2864
Technology Center2800
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