System for monitoring and controlling an integrated circuit testing machine | Patent Number 11428735

US 11428735 B1
Application Number16817564
Publication Number-
Pendency2 years, 5 months, 21 days
Filled DateMar 12, 2020
Priority DateMar 14, 2019
Publication Date-
Expiration DateMar 13, 2039
Inventor/ApplicantsViren Khandekar
Edson Macgregor Arca Leano
Hilario Sanchez Jacala
Ruel Jucoy Mijares
ExaminesHOLLINGTON, JERMELE M
Art Unit2858
Technology Center2800
Assignments
Maxim Integrated
Current
Maxim IntegratedAnalog Devices
Original
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