Calculation method for a dual-energy X-ray imaging system | Patent Number 11693146

US 11693146 B2
Application Number17573756
Publication NumberUS 20220308252 A1
Pendency1 year, 5 months, 23 days
Filled DateJan 12, 2022
Priority DateJan 12, 2022
Publication DateSep 29, 2022
Expiration DateJan 11, 2042
Inventor/ApplicantsSHENG-PIN TSENG
YU-CHING NI
Sheng-Pin Tseng
Chia-Hao Chang
CHIA-HAO CHANG
Yu-Ching Ni
ExaminesKIKNADZE, IRAKLI
Art Unit2884
Technology Center2800
Assignments
Korea Atomic Energy Research Institute
Current
Korea Atomic Energy Research Institute
Original
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