System and method for generating training data sets for specimen defect detection | Patent Number 11727672

US 11727672 B1

Application Number17938885

Publication Number-

Pendency10 months, 12 days

Filled DateOct 7, 2022

Priority DateMay 24, 2022

Publication Date-

Expiration DateMay 23, 2042

Inventor/ApplicantsJohn B. Putman
Jonathan Lee
Anuj Doshi

ExaminesAHMED, SAMIR ANWAR

Art Unit2665

Technology Center2600

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