Low cost test strip and method to measure analyte | Patent Number 11747324
US 11747324 B2Filled DateDec 21, 2020
Priority DateJun 9, 2014
Publication DateJun 17, 2021
Expiration DateJun 8, 2034
Inventor/ApplicantsThomas T. Morgan
David L. Carnahan
David L. CARNAHAN
Bryan NOLAN
Thomas T. MORGAN
Bryan Nolan
David L. Carnahan
David L. CARNAHAN
Bryan NOLAN
Thomas T. MORGAN
Bryan Nolan
ExaminesSIEFKE, SAMUEL P
Art Unit1758
Technology Center1700
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