Sample observation device and sample observation method | Patent Number 11822066

US 11822066 B2
Application Number17751818
Publication NumberUS 20220283420 A1
Pendency1 year, 6 months, 1 day
Filled DateMay 24, 2022
Priority DateAug 15, 2017
Publication DateSep 8, 2022
Expiration DateAug 14, 2037
Inventor/ApplicantsSatoshi Yamamoto
Masanori MATSUBARA
Satoshi YAMAMOTO
Norikazu SUGIYAMA
Masanori Matsubara
Norikazu Sugiyama
ExaminesALCON, FERNANDO
Art Unit2425
Technology Center2400
Assignments
Hamamatsu Photonics
Current
Hamamatsu Photonics
Original
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