Apparatus and method for diagnosing no fault failure found in electronic systems | Patent Number 11829229
US 11829229 B2Filled DateApr 26, 2022
Priority DateApr 26, 2022
Publication DateOct 26, 2023
Expiration DateApr 25, 2042
Inventor/ApplicantsKirk A. Lillestolen
William E. Villano
William E. Villano
ExaminesIQBAL, NADEEM
Art Unit2114
Technology Center2100
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