Defect detection of a component in an assembly | Patent Number 11842482
US 11842482 B2Filled DateDec 23, 2022
Priority DateMay 22, 2020
Publication DateMay 4, 2023
Expiration DateMay 21, 2040
Inventor/ApplicantsGeorge Huang
Yan Zhou
Jisheng Li
Yan Zhou
Jisheng Li
ExaminesLIEW, ALEX KOK SOON
Art Unit2668
Technology Center2600
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