Defect detection for additive manufacturing systems | Patent Number 11858207
US 11858207 B2Filled DateFeb 21, 2023
Priority DateAug 22, 2014
Publication DateJun 29, 2023
Expiration DateAug 21, 2034
Inventor/ApplicantsMark J. Cola
R. Bruce Madigan
Vivek R. Dave
Martin S. Piltch
R. Bruce Madigan
Vivek R. Dave
Martin S. Piltch
ExaminesLIANG, ANTHONY M
Art Unit1734
Technology Center1700
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