Defect detection and image comparison of components in an assembly | Patent Number 11900666

US 11900666 B2
Application Number18151386
Publication NumberUS 20230162495 A1
Pendency1 year, 1 month, 8 days
Filled DateJan 6, 2023
Priority Date-
Publication DateMay 25, 2023
Expiration DateJan 5, 2043
Inventor/ApplicantsGeorge Huang
Jisheng Li
Yan Zhou
ExaminesCHAWAN, SHEELA C
Art Unit2669
Technology Center2600
Assignments
Future Dial Inc.
Current
Future Dial Inc.
Original
Law Firm
You must be logged in to view
Login
Attorneys
Subscription-Only
View Concierge Program
Patent Prosecution report image

Empower your practice with Patexia Publication Prosecution IP Module.

Get access to our exclusive rankings and unlock powerful data.
Check our Latest ReportPurchase IP Module

Looking for a Publication Attorney?

Get in touch with our team or create your account to start exploring a network of over 120K attorneys.