System, method and apparatus for macroscopic inspection of reflective specimens | Patent Number 11961210

US 11961210 B2
Application Number18175216
Publication NumberUS 20230206405 A1
Pendency1 year, 1 month, 19 days
Filled DateFeb 27, 2023
Priority DateAug 7, 2019
Publication DateJun 29, 2023
Expiration DateAug 6, 2039
Inventor/ApplicantsMichael Moskie
Damas Limoge
John B. Putman
Jonathan Lee
Matthew C. Putman
ExaminesWONG, ALLEN C
Art Unit2488
Technology Center2400
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