Defect detecting method based on dimensionality reduction of data, electronic device, and storage medium | Patent Publication Number 20220254148

US 20220254148 A1
Patent NumberUS 12112522 B2
Application Number17587086
Filled DateJan 28, 2022
Priority DateJan 28, 2022
Publication DateAug 11, 2022
Original AssigneeFoxconn Technology Group
Current AssigneeFoxconn Technology Group
Inventor/ApplicantsTZU-CHEN LIN
Tzu-Chen Lin
CHIN-PIN KUO
TUNG-TSO TSAI
Chin-Pin Kuo
Tung-Tso Tsai
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