Method and Apparatus for On-Chip Testing of High Speed Frequency Dividers | Patent Publication Number 20090322311

US 20090322311 A1
Patent Number-
Application Number12163166
Filled DateJun 27, 2008
Priority DateJun 27, 2008
Publication DateDec 31, 2009
Original AssigneeInternational Business Machines
Current AssigneeToshiba America Electronic Components
Inventor/ApplicantsMasaaki Kaneko
Jieming Qi
Eskinder Hailu
David William Boerstler
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