INTEGRATED CIRCUIT COMPRISING TEST CIRCUITRY FOR TESTING FAN-OUT PATHS OF A TEST CONTROL PRIMARY INPUT | Patent Publication Number 20140365838

US 20140365838 A1
Patent Number-
Application Number13914753
Filled DateJun 11, 2013
Priority DateJun 11, 2013
Publication DateDec 11, 2014
Original Assignee
Current AssigneeAgere Systems Broadcom
Lsi Broadcom
Inventor/ApplicantsRamesh C. Tekumalla
Vijay Sharma
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