TEST CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME | Patent Publication Number 20240120014

US 20240120014 A1
Patent Number-
Application Number18100969
Filled DateJan 24, 2023
Priority Date-
Publication DateApr 11, 2024
Original AssigneeSk Group
Current AssigneeSk Hynix
Inventor/ApplicantsSuk Hwan CHOI
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