MEMORY DEVICE AND METHOD OF TESTING THE MEMORY DEVICE FOR FAILURE | Patent Publication Number 20240120020

US 20240120020 A1
Patent Number-
Application Number18126267
Filled DateMar 24, 2023
Priority Date-
Publication DateApr 11, 2024
Original AssigneeSk Group
Current AssigneeSk Hynix
Inventor/ApplicantsByung Wook BAE
Jung Ryul AHN
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