Built-in self test circuit for measuring phase noise of a phase locked loop | Patent Publication Number 20220260634

US 20220260634 A1
Patent NumberUS 11555851 B2
Application Number17736904
Filled DateMay 4, 2022
Priority DateOct 31, 2018
Publication DateAug 18, 2022
Original AssigneeTaiwan Semiconductor Manufacturing Company
Current AssigneeTaiwan Semiconductor Manufacturing Company
Inventor/ApplicantsMao-Hsuan CHOU
Ya-Tin CHANG
Ruey-Bin SHEEN
Ya-Tin Chang
Mao-Hsuan Chou
Ruey-Bin Sheen
Chih-Hsien Chang
Chih-Hsien CHANG
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