Kretelia Graham
Examiner (ID: 5187, Phone: (571)272-5055 , Office: P/2825 )
Most Active Art Unit | 2827 |
Art Unit(s) | 2817, 2615, 2825, 2827 |
Total Applications | 668 |
Issued Applications | 560 |
Pending Applications | 1 |
Abandoned Applications | 74 |
Applications
Application number | Title of the application | Filing Date | Status |
---|---|---|---|
Array
(
[id] => 1121392
[patent_doc_number] => 06798208
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-09-28
[patent_title] => 'System and method for locating a fracture in an earth formation'
[patent_app_type] => B2
[patent_app_number] => 10/775782
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[pdf_file] => patents/06/798/06798208.pdf
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/775782 | System and method for locating a fracture in an earth formation | Feb 9, 2004 | Issued |
Array
(
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[patent_doc_number] => 06812707
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[patent_kind] => B2
[patent_issue_date] => 2004-11-02
[patent_title] => 'Detection element for objects and detection device using the same'
[patent_app_type] => B2
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[patent_app_date] => 2003-05-19
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/440138 | Detection element for objects and detection device using the same | May 18, 2003 | Issued |
Array
(
[id] => 6615271
[patent_doc_number] => 20030210041
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[patent_kind] => A1
[patent_issue_date] => 2003-11-13
[patent_title] => 'Eddy current measuring system for monitoring and controlling a chemical vapor deposition (CVD) process'
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Array
(
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[patent_issue_date] => 2003-11-06
[patent_title] => 'Eddy current measuring system for monitoring and controlling a physical vapor deposition(PVD) process'
[patent_app_type] => new
[patent_app_number] => 10/414845
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Array
(
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[patent_issue_date] => 2003-11-13
[patent_title] => 'Standalone eddy current measuring system for thickness estimation of conductive films'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/417048 | Standalone eddy current measuring system for thickness estimation of conductive films | Apr 13, 2003 | Issued |
Array
(
[id] => 6723697
[patent_doc_number] => 20030206009
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[patent_kind] => A1
[patent_issue_date] => 2003-11-06
[patent_title] => 'Integrated eddy current measuring system for monitoring and controlling multiple semiconductor wafer fabrication processes'
[patent_app_type] => new
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Array
(
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[patent_title] => 'Eddy current measuring system for monitoring and controlling a CMP process'
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[patent_app_number] => 10/417042
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[firstpage_image] =>[orig_patent_app_number] => 10417042
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/417042 | Eddy current measuring system for monitoring and controlling a CMP process | Apr 13, 2003 | Issued |
Array
(
[id] => 1190246
[patent_doc_number] => 06734670
[patent_country] => US
[patent_kind] => B2
[patent_issue_date] => 2004-05-11
[patent_title] => 'Determining a surface profile of an object'
[patent_app_type] => B2
[patent_app_number] => 10/375804
[patent_app_country] => US
[patent_app_date] => 2003-02-26
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[patent_drawing_sheets_cnt] => 3
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[firstpage_image] =>[orig_patent_app_number] => 10375804
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/375804 | Determining a surface profile of an object | Feb 25, 2003 | Issued |
Array
(
[id] => 6795086
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[patent_issue_date] => 2003-09-18
[patent_title] => 'Electromagnetic analysis of concrete tensioning wires'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/361865 | Electromagnetic analysis of concrete tensioning wires | Feb 10, 2003 | Issued |
Array
(
[id] => 7629248
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[patent_issue_date] => 2004-11-16
[patent_title] => 'Magnetic detector extendable wand'
[patent_app_type] => B2
[patent_app_number] => 10/348998
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[patent_app_date] => 2003-01-23
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[firstpage_image] =>[orig_patent_app_number] => 10348998
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/348998 | Magnetic detector extendable wand | Jan 22, 2003 | Issued |
Array
(
[id] => 6704671
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[patent_title] => 'Variable permeability magnetic field sensor and method'
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[firstpage_image] =>[orig_patent_app_number] => 10342612
[rel_patent_id] =>[rel_patent_doc_number] =>) 10/342612 | Variable permeability magnetic field sensor and method | Jan 14, 2003 | Issued |
Array
(
[id] => 6845539
[patent_doc_number] => 20030164706
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[patent_title] => 'Method and apparatus for full offset resistivity imaging for use in boreholes'
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Array
(
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Array
(
[id] => 1109449
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[patent_title] => 'Compact, autonomous robotic detection and identification sensor system of unexploded ordnance site remediation'
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Array
(
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Array
(
[id] => 7624984
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[patent_title] => 'Measuring device with magneto-resistive electrodes, and measuring method'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/330999 | Measuring device with magneto-resistive electrodes, and measuring method | Dec 26, 2002 | Issued |
Array
(
[id] => 7459349
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[patent_title] => 'SYSTEM, METHOD AND APPARATUS FOR THIN-FILM SUBSTRATE SIGNAL SEPARATION USING EDDY CURRENT'
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Array
(
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[patent_title] => 'METHOD OF DETERMINING VERTICAL AND HORIZONTAL RESISTIVITY, AND RELATIVE DIP IN ANISOTROPIC EARTH FORMATIONS HAVING AN ARBITRARY ELECTRO-MAGNETIC ANTENNA COMBINATION AND ORIENTATION WITH ADDITIONAL ROTATION AND POSITION MEASUREMENTS'
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Array
(
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[patent_title] => 'Borehole compensation system and method for a resistivity logging tool'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/293708 | Method, apparatus and system for compensating the effects of borehole variations | Nov 12, 2002 | Issued |
Array
(
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[patent_title] => 'Apparatus and method for resistivity well logging'
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[rel_patent_id] =>[rel_patent_doc_number] =>) 10/291440 | Apparatus and method for resistivity well logging | Nov 7, 2002 | Issued |