Company
Agere Systems (Broadcom)
0 Case(s) (Last 5 Years)
Patents Prosecuted
| Application number | Title of the patent | IPC | Filing Date | Decision Date |
|---|---|---|---|---|
| 13859507 | Local Repair Signature Handling for Repairable Memories | G06F | Apr 8, 2013 | Mar 31, 2015 |
| 13858064 | System, method, and computer program product for inserting a gap in information sent from a drive to a host device | G06F | Apr 6, 2013 | Dec 23, 2013 |
| 13856179 | Method of optimizing solid state drive soft retry voltages | G11C | Apr 2, 2013 | May 4, 2015 |
| 13855804 | SYSTEM AND METHOD FOR LARGE OBJECT CACHE MANAGEMENT IN A NETWORK | G06F | Apr 2, 2013 | Oct 22, 2015 |
| 13855116 | Host command based read disturb methodology | G06F | Apr 1, 2013 | Jul 27, 2015 |
| 13854263 | Nonvolatile memory data recovery after power failure | G11C | Mar 31, 2013 | Oct 24, 2016 |
| 13853282 | Dynamic log likelihood ratio quantization for solid state drive controllers | H03M, G11C, G06F | Mar 28, 2013 | Sep 19, 2016 |
| 13852548 | Scan Chain Reconfiguration and Repair | G06F | Mar 27, 2013 | Mar 5, 2016 |
| 13852852 | Generating partially sparse generator matrix for a quasi-cyclic low-density parity-check encoder | H03M | Mar 27, 2013 | May 18, 2015 |
| 13838101 | HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON BIAS TEMPERATURE INSTABILITY - HOT CARRIER INJECTION INTERACTION | G06F | Mar 14, 2013 | Dec 19, 2016 |
| 13833691 | MULTI-READ PORT MEMORY | G11C | Mar 14, 2013 | Jul 12, 2015 |
| 13838268 | BIAS-TEMPERATURE INSTABILITY RELIABILITY CHECKS BASED ON GATE VOLTAGE THRESHOLD FOR RECOVERY | G06F | Mar 14, 2013 | May 5, 2016 |
| 13833198 | Modular, Scalable Rigid Flex Memory Module | G11C | Mar 14, 2013 | Sep 2, 2015 |
| 13837929 | HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON GATE VOLTAGE DEPENDENCY | G06F | Mar 14, 2013 | Jan 11, 2015 |
| 13837561 | Using entire area of chip in TDDB checking | G06F | Mar 14, 2013 | Jul 7, 2014 |
| 13837189 | CHECKING FOR HIGH BACK-BIAS IN LONG GATE-LENGTH, HIGH TEMPERATURE CASES | G06F | Mar 14, 2013 | Jun 23, 2016 |
| 13840609 | Techniques for reducing memory write operations using coalescing memory buffers and difference information | G06F | Mar 14, 2013 | Mar 10, 2014 |
| 13832633 | Retention detection and/or channel tracking policy in a flash memory based storage system | G11C | Mar 14, 2013 | Apr 13, 2015 |
| 13837348 | Breaking up long-channel field effect transistor into smaller segments for reliability modeling | G06F | Mar 14, 2013 | Oct 27, 2014 |
| 13837723 | HOT-CARRIER INJECTION RELIABILITY CHECKS BASED ON BACK BIAS EFFECT ON THRESHOLD VOLTAGE | G06F | Mar 14, 2013 | Apr 13, 2016 |