Built-in self test circuit for measuring phase noise of a phase locked loop | Patent Number 11555851

US 11555851 B2
Application Number17736904
Publication NumberUS 20220260634 A1
Pendency8 months, 18 days
Filled DateMay 4, 2022
Priority DateOct 31, 2018
Publication DateAug 18, 2022
Expiration DateOct 30, 2038
Inventor/ApplicantsMao-Hsuan CHOU
Ruey-Bin SHEEN
Chih-Hsien Chang
Ya-Tin Chang
Chih-Hsien CHANG
Mao-Hsuan Chou
Ruey-Bin Sheen
Ya-Tin CHANG
ExaminesHOUSTON, ADAM D
Art Unit2842
Technology Center2800
Assignments
Taiwan Semiconductor Manufacturing Company
Current
Taiwan Semiconductor Manufacturing Company
Original
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